An improved semi-empirical procedure for Compton scattering technique applied to measure pipeline thickness
Vo Hoang Nguyen, Nguyen Huu Bao, Huynh Dinh Chuong, Nguyen Duy Thong, Tran Thien Thanh & Chau Van Tao
Journal of Radioanalytical and Nuclear Chemistry (2021)
Abstract:
This study aims to formulate semi-empirical processing applied to analyze simulated and experimental scattering spectra on pipeline samples for estimating the intensity of the single scattering component for the Compton scattering technique. Firstly, a procedure has been developed based on probability density functions of each scattering component, which are obtained by GEANT4. Secondly, sixteen targets are simulated with MCNP6 to validate the proposed procedure. It is shown that the relative deviation for all samples is under 3%. Thirdly, the nine calculated thickness of pipeline samples is determined with a maximum relative deviation lower than 5% in comparing to calibration thickness.
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